Applied survival analysis: regression modeling of time-to-event data/ David W. Hosmer, Stanley Lemeshow, Susanne May
Material type: TextLanguage: English Series: Wiley series in probability and statisticsPublication details: Hoboken, New Jersey: Wiley-Interscience, c2008Edition: 2nd edDescription: xiii, 392p.: ill.,; 25cmISBN:- 9780471754992
- 610.727 HOS
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
Open Shelf | NIH Library NIH Library | Available | M000003115 |
Includes bibliographical references (p. 365-381) and index
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